Samsung SSDs - Am at the end of life?
Mark Phillips
mark at phillipsmarketing.biz
Sun Jan 29 09:22:01 MST 2017
I ran GSmartControl on my two SSDs (Ubuntu 14.04 laptop), and I see a lot
of pre-fail indicators in the reports (attached). Does this mean I am
approaching the drives end of life and I need to replace them?
I have also read that each SSD manufacturer codes the SMART attributes
differently (
https://askubuntu.com/questions/325283/how-do-i-check-the-health-of-a-ssd).
Not sure if this is true today, since these posts are several years old.
I looked at this "dictionary of terms" for Samsung drives (
http://www.samsung.com/global/business/semiconductor/minisite/SSD/M2M/download/07_Communicating_With_Your_SSD.pdf).
I am confused as to why the values in my reports are considered "pre-fail"
or "old age" when many of them are zero.
Can you interpret these reports for me, or point me to some documentation
that will help me understand what they are telling me?
Thanks!
Mark
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smartctl 6.2 2013-07-26 r3841 [x86_64-linux-3.13.0-107-generic] (local build)
Copyright (C) 2002-13, Bruce Allen, Christian Franke, www.smartmontools.org
=== START OF INFORMATION SECTION ===
Device Model: Samsung SSD 840 EVO 1TB mSATA
Serial Number: S1KRNEAF402342X
LU WWN Device Id: 5 002538 844584d30
Firmware Version: EXT41B6Q
User Capacity: 1,000,204,886,016 bytes [1.00 TB]
Sector Size: 512 bytes logical/physical
Rotation Rate: Solid State Device
Device is: Not in smartctl database [for details use: -P showall]
ATA Version is: ACS-2, ATA8-ACS T13/1699-D revision 4c
SATA Version is: SATA 3.1, 6.0 Gb/s (current: 6.0 Gb/s)
Local Time is: Sat Jan 28 09:08:25 2017 MST
SMART support is: Available - device has SMART capability.
SMART support is: Enabled
=== START OF READ SMART DATA SECTION ===
SMART overall-health self-assessment test result: PASSED
General SMART Values:
Offline data collection status: (0x00) Offline data collection activity
was never started.
Auto Offline Data Collection: Disabled.
Self-test execution status: ( 0) The previous self-test routine completed
without error or no self-test has ever
been run.
Total time to complete Offline
data collection: (15000) seconds.
Offline data collection
capabilities: (0x53) SMART execute Offline immediate.
Auto Offline data collection on/off support.
Suspend Offline collection upon new
command.
No Offline surface scan supported.
Self-test supported.
No Conveyance Self-test supported.
Selective Self-test supported.
SMART capabilities: (0x0003) Saves SMART data before entering
power-saving mode.
Supports SMART auto save timer.
Error logging capability: (0x01) Error logging supported.
General Purpose Logging supported.
Short self-test routine
recommended polling time: ( 2) minutes.
Extended self-test routine
recommended polling time: ( 250) minutes.
SCT capabilities: (0x003d) SCT Status supported.
SCT Error Recovery Control supported.
SCT Feature Control supported.
SCT Data Table supported.
SMART Attributes Data Structure revision number: 1
Vendor Specific SMART Attributes with Thresholds:
ID# ATTRIBUTE_NAME FLAG VALUE WORST THRESH TYPE UPDATED WHEN_FAILED RAW_VALUE
5 Reallocated_Sector_Ct 0x0033 100 100 010 Pre-fail Always - 0
9 Power_On_Hours 0x0032 095 095 000 Old_age Always - 20445
12 Power_Cycle_Count 0x0032 099 099 000 Old_age Always - 198
177 Wear_Leveling_Count 0x0013 099 099 000 Pre-fail Always - 3
179 Used_Rsvd_Blk_Cnt_Tot 0x0013 100 100 010 Pre-fail Always - 0
181 Program_Fail_Cnt_Total 0x0032 100 100 010 Old_age Always - 0
182 Erase_Fail_Count_Total 0x0032 100 100 010 Old_age Always - 0
183 Runtime_Bad_Block 0x0013 100 100 010 Pre-fail Always - 0
187 Reported_Uncorrect 0x0032 100 100 000 Old_age Always - 0
190 Airflow_Temperature_Cel 0x0032 047 017 000 Old_age Always - 53
195 Hardware_ECC_Recovered 0x001a 200 200 000 Old_age Always - 0
199 UDMA_CRC_Error_Count 0x003e 100 100 000 Old_age Always - 0
235 Unknown_Attribute 0x0012 099 099 000 Old_age Always - 51
241 Total_LBAs_Written 0x0032 099 099 000 Old_age Always - 15931263658
SMART Error Log Version: 1
No Errors Logged
SMART Self-test log structure revision number 1
Num Test_Description Status Remaining LifeTime(hours) LBA_of_first_error
# 1 Short offline Completed without error 00% 563 -
SMART Selective self-test log data structure revision number 1
SPAN MIN_LBA MAX_LBA CURRENT_TEST_STATUS
1 0 0 Not_testing
2 0 0 Not_testing
3 0 0 Not_testing
4 0 0 Not_testing
5 0 0 Not_testing
Selective self-test flags (0x0):
After scanning selected spans, do NOT read-scan remainder of disk.
If Selective self-test is pending on power-up, resume after 0 minute delay.
-------------- next part --------------
smartctl 6.2 2013-07-26 r3841 [x86_64-linux-3.13.0-107-generic] (local build)
Copyright (C) 2002-13, Bruce Allen, Christian Franke, www.smartmontools.org
=== START OF INFORMATION SECTION ===
Device Model: Samsung SSD 840 EVO 1TB
Serial Number: S1D9NSAF731471M
LU WWN Device Id: 5 002538 8a059c041
Firmware Version: EXT0BB6Q
User Capacity: 1,000,204,886,016 bytes [1.00 TB]
Sector Size: 512 bytes logical/physical
Rotation Rate: Solid State Device
Device is: Not in smartctl database [for details use: -P showall]
ATA Version is: ACS-2, ATA8-ACS T13/1699-D revision 4c
SATA Version is: SATA 3.1, 6.0 Gb/s (current: 6.0 Gb/s)
Local Time is: Sat Jan 28 09:13:07 2017 MST
SMART support is: Available - device has SMART capability.
SMART support is: Enabled
=== START OF READ SMART DATA SECTION ===
SMART overall-health self-assessment test result: PASSED
General SMART Values:
Offline data collection status: (0x00) Offline data collection activity
was never started.
Auto Offline Data Collection: Disabled.
Self-test execution status: ( 0) The previous self-test routine completed
without error or no self-test has ever
been run.
Total time to complete Offline
data collection: (15000) seconds.
Offline data collection
capabilities: (0x53) SMART execute Offline immediate.
Auto Offline data collection on/off support.
Suspend Offline collection upon new
command.
No Offline surface scan supported.
Self-test supported.
No Conveyance Self-test supported.
Selective Self-test supported.
SMART capabilities: (0x0003) Saves SMART data before entering
power-saving mode.
Supports SMART auto save timer.
Error logging capability: (0x01) Error logging supported.
General Purpose Logging supported.
Short self-test routine
recommended polling time: ( 2) minutes.
Extended self-test routine
recommended polling time: ( 250) minutes.
SCT capabilities: (0x003d) SCT Status supported.
SCT Error Recovery Control supported.
SCT Feature Control supported.
SCT Data Table supported.
SMART Attributes Data Structure revision number: 1
Vendor Specific SMART Attributes with Thresholds:
ID# ATTRIBUTE_NAME FLAG VALUE WORST THRESH TYPE UPDATED WHEN_FAILED RAW_VALUE
5 Reallocated_Sector_Ct 0x0033 100 100 010 Pre-fail Always - 0
9 Power_On_Hours 0x0032 096 096 000 Old_age Always - 19250
12 Power_Cycle_Count 0x0032 099 099 000 Old_age Always - 241
177 Wear_Leveling_Count 0x0013 098 098 000 Pre-fail Always - 22
179 Used_Rsvd_Blk_Cnt_Tot 0x0013 100 100 010 Pre-fail Always - 0
181 Program_Fail_Cnt_Total 0x0032 100 100 010 Old_age Always - 0
182 Erase_Fail_Count_Total 0x0032 100 100 010 Old_age Always - 0
183 Runtime_Bad_Block 0x0013 100 100 010 Pre-fail Always - 0
187 Reported_Uncorrect 0x0032 100 100 000 Old_age Always - 0
190 Airflow_Temperature_Cel 0x0032 063 043 000 Old_age Always - 37
195 Hardware_ECC_Recovered 0x001a 200 200 000 Old_age Always - 0
199 UDMA_CRC_Error_Count 0x003e 100 100 000 Old_age Always - 0
235 Unknown_Attribute 0x0012 099 099 000 Old_age Always - 52
241 Total_LBAs_Written 0x0032 099 099 000 Old_age Always - 55069190173
SMART Error Log Version: 1
No Errors Logged
SMART Self-test log structure revision number 1
Num Test_Description Status Remaining LifeTime(hours) LBA_of_first_error
# 1 Short offline Completed without error 00% 38 -
SMART Selective self-test log data structure revision number 1
SPAN MIN_LBA MAX_LBA CURRENT_TEST_STATUS
1 0 0 Not_testing
2 0 0 Not_testing
3 0 0 Not_testing
4 0 0 Not_testing
5 0 0 Not_testing
Selective self-test flags (0x0):
After scanning selected spans, do NOT read-scan remainder of disk.
If Selective self-test is pending on power-up, resume after 0 minute delay.
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